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Sem calibration in the micrometer and submicrometer ranges by means of a periodic linear measure

✍ Scribed by Ch. P. Volk; Yu. A. Novikov; A. V. Rakov

Publisher: Springer US
Year: 2000
Tongue: English
Weight: 378 KB
Volume: 43
Category: Article
ISSN: 0543-1972
DOI: 10.1007/bf02503672

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