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Sem calibration in the micrometer and submicrometer ranges by means of a periodic linear measure

โœ Scribed by Ch. P. Volk; Yu. A. Novikov; A. V. Rakov


Publisher
Springer US
Year
2000
Tongue
English
Weight
378 KB
Volume
43
Category
Article
ISSN
0543-1972

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โœ M. Okaji; N. Yamada; H. Kato; K. Nara ๐Ÿ“‚ Article ๐Ÿ“… 1997 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 546 KB

The thermal expansivities of several grades of copper were measured in the temperature range 20-300 K by means of an absolute laser interferometric dilatometer. The present results for copper standard reference material (NIST; SRM 736) and three commercially available kinds of copper, such as a high