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Self-trapping of thed-dcharge transfer exciton in bulk NiO evidenced by X-ray excited luminescence

✍ Scribed by V. I. Sokolov, V. A. Pustovarov, V. N. Churmanov, V. Yu. Ivanov, N. B. Gruzdev, P. S. Sokolov, A. N. Baranov, A. S. Moskvin

Book ID: 119882226
Publisher: SP MAIK Nauka/Interperiodica
Year: 2012
Tongue: English
Weight: 309 KB
Volume: 95
Category: Article
ISSN: 0021-3640
DOI: 10.1134/s0021364012100116

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