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Self-Testing of Universal and Fault-Tolerant Sets of Quantum Gates

✍ Scribed by van Dam, Wim; Magniez, Frédéric; Mosca, Michele; Santha, Miklos


Book ID
118181171
Publisher
Society for Industrial and Applied Mathematics
Year
2007
Tongue
English
Weight
250 KB
Volume
37
Category
Article
ISSN
0097-5397

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