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Self-testing of fully differential multistage circuits using common-mode excitation

✍ Scribed by Wojciech Toczek

Book ID: 108210788
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 391 KB
Volume: 48
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2008.09.007

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