Self-pruning binary tree architectures for improved interconnection fault tolerance : C. Sul, R. D. McLeod and W. Kinsner. Microelectron. J. 23, 197 (1992)

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 125 KB
• Volume: 32
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(92)90358-r