Self-consistent theory of diagonal and off-diogonal disorder in the screened impurity band of doped semiconductors: Norberto Majlis and Enrique V. Anda Solid St. Communs 45 (7), 561 (1983)

• Book ID: 104157177
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 87 KB
• Volume: 15
• Category: Article
• ISSN: 0026-2692
• DOI: 10.1016/s0026-2692(84)80117-2

✦ Synopsis

World Alastragts continued from page 63 charge, an in situ spectroscopic automatic ellipsometer has been associated with a multipole reactor. The ellipsometer is described; it is based on the photo-acoustic modulation technique and allows a fast data acquisition rate, From real tim~ ellipsometry at a fixed wavelength on a growing film, the growth rate and the refractive index of the material are determined and some indications are given on the growth process. The dielectric constant spectrum measurement allows a posteriori characterization of thd influence of plasma conditions or thermal treatments on the optical properties of the sample without air contamination.