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Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits
✍ Scribed by Jung Hwan Choi; Bansal, A.; Meterelliyoz, M.; Murthy, J.; Roy, K.
- Book ID
- 117907939
- Publisher
- IEEE
- Year
- 2007
- Tongue
- English
- Weight
- 722 KB
- Volume
- 26
- Category
- Article
- ISSN
- 0278-0070
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