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Self-Compensating Design for Reduction of Timing and Leakage Sensitivity to Systematic Pattern-Dependent Variation

✍ Scribed by Gupta, P.; Kahng, A.B.; Youngmin Kim; Sylvester, D.


Book ID
117907893
Publisher
IEEE
Year
2007
Tongue
English
Weight
613 KB
Volume
26
Category
Article
ISSN
0278-0070

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