' This Book Provides A Detailed Treatment Of Radiation Effects In Electronic Devices, Including Effects At The Material, Device, And Circuit Levels. The Emphasis Is On Transient Effects Caused By Single Ionizing Particles (single-event Effects And Soft Errors) And Effects Produced By The Cumulative Energy Deposited By The Radiation (total Ionizing Dose Effects). Bipolar (si And Sige), Metalβoxideβsemiconductor (mos), And Compound Semiconductor Technologies Are Discussed. In Addition To Considering The Specific Issues Associated With High-performance Devices And Technologies, The Book Includes The Background Material Necessary For Understanding Radiation Effects At A More General Level. Contents:single Event Effects In Avionics And On The Ground (e Normand)soft Errors In Commercial Integrated Circuits (r C Baumann)system Level Single Event Upset Mitigation Strategies (w F Heidergott)space Radiation Effects In Optocouplers (r A Reed Et Al.)the Effects Of Space Radiation Exposure On Power Mosfets: A Review (k Shenai Et Al.)total Dose Effects In Linear Bipolar Integrated Circuits (h J Barnaby)hardness Assurance For Commercial Microelectronics (r L Pease)switching Oxide Traps (t R Oldham)online And Realtime Dosimetry Using Optically Stimulated Luminescence (l Dusseau & J Gasiot)and Other Articles Readership: Practitioners, Researchers, Managers And Graduate Students In Electrical And Electronic Engineering, Semiconductor Science And Technology, And Microelectronics. Keywords:radiation Effects;soft Errors;single-event Effects;space;radiation;microelectronics Reliability;terrestrial Radiationkey Features:extensive Treatment Of Radiation Effects In High Performance Devicescontributions From A Wide Range Of Experts In The Radiation-effects Fielddetailed Consideration Of Radiation Effects In Commercial Mos And Bipolar Technologies, As Well As Soi Devices, Power Devices, Photonics, And High-energy Physics Experimentsdescription Of Radiation Effects In Terrestrial And Space Environmentsoverview Of Design Approaches For Radiation-tolerant Integrated Circuitsreviews:βron Schrimpf And Dan Fleetwood Are World Renowned Experts In Radiation Effects. They Have Put Together A Winning Team Of Experienced Authors To Explain The Nature And Implications Of Transient And Permanent Radiation Damage Resulting From Ionizing Particles. This Book Is A Great Resource For The Practicing Engineer Or Beginner Who Wants To Understand Whether Modern Devices, Circuits, And Systems Will Survive In Radiation Environments. One Thing Is For Certain β Radiation Damage Will Become Increasingly Important As Device Geometries Shrink And Stored Information Is But A Few Electrons.βdr Peter S Winokur Sandia National Laboratories '