SEL-Sensitive Area Mapping and the Effects of Reflection and Diffraction From Metal Lines on Laser SEE Testing

✍ Scribed by Dodds, N. A.; Hooten, N. C.; Reed, R. A.; Schrimpf, R. D.; Warner, J. H.; Roche, N. J.-H.; McMorrow, D.; Buchner, S.; Jordan, S.; Pellish, J. A.; Bennett, ; Gaspard, N. J.; King, M. P.

• Book ID: 121657938
• Publisher: IEEE
• Year: 2013
• Tongue: English
• Weight: 880 KB
• Volume: 60
• Category: Article
• ISSN: 0018-9499
• DOI: 10.1109/TNS.2013.2246189