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Secondary ion mass spectrometry–basic concepts, instrumental aspects, applications and trends. A. BENNINGHOVEN, F. G. RUDENAUER and H. W. WERNER, Wiley, New York, 1987, 1277 pages

✍ Scribed by J. C. Vickerman


Book ID
104591977
Publisher
John Wiley and Sons
Year
1987
Tongue
English
Weight
144 KB
Volume
10
Category
Article
ISSN
0142-2421

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