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Secondary ion mass spectrometry study of lightly doped P-type GaAs films grown by molecular beam epitaxy: J B Clegg et al, J Appl Phys, 53 (6), 1982, 4518–4520


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
188 KB
Volume
33
Category
Article
ISSN
0042-207X

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