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Secondary-ion mass spectrometry (SIMS) of metal surfaces under oxygen. I. Group VIII elements

✍ Scribed by K.D. Klöppel; E. Jegers; G. Von Bünau

Publisher: Elsevier Science
Year: 1983
Weight: 680 KB
Volume: 49
Category: Article
ISSN: 0020-7381
DOI: 10.1016/0020-7381(83)85072-4

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