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Secondary ion mass spectrometry SIMS IX: edited by A. Benninghoven, Y. Nihei, R. Shimizu and H.W. Werner, John Wiley and Sons, Chichester, 1994, 983 pp., £120.00, ISBN 0-471-94218-9

✍ Scribed by Pirjo Vainiotalo

Book ID: 103908454
Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 79 KB
Volume: 51
Category: Article
ISSN: 1386-1425
DOI: 10.1016/0584-8539(95)90161-2

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📜 SIMILAR VOLUMES

Secondary ion mass spectrometry. SIMS IX

Secondary ion mass spectrometry. SIMS IX: A. Benninghoven, Y. Nihei, R. Shimiza and H.W. Werner, Wiley, Chichester, 1994 (ISBN 0-471-94218-9). xxiv + 983 pp. Price £120.00

📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 104 KB

Secondary ion mass spectrometry: SIMS VI

Secondary ion mass spectrometry: SIMS VIII: Edited by A Benninghoven, K I F Janssen, J Tumpner and HW Werner, Proceedings of the Eighth International Conference held in Amsterdam, 15–20 September 1991. John Wiley, Chichester, 1992, ISBN 0-471-93064-4, XXV + 917 pp. Price £115

📂 Article 📅 1994 🏛 Elsevier Science 🌐 English ⚖ 279 KB