Second harmonic imaging of individual se
Second harmonic imaging of individual semiconductor nanostructures for scanning far field microscopy
β
V. Lozovski; S. Bozhevolnyi
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Article
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2002
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Elsevier Science
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English
β 332 KB
A self-consistent approach for the solution of the Lippmann-Schwinger equations for both fundamental and second harmonic frequencies was used to calculate the ΓΏeld generated by a system at second harmonic (SH). The system consisting of a nonlinear parallelepiped object and nonlinear substrate was il