Second-Harmonic Microscopy — New Tool for the Remote Sensing of Interfaces

✍ Scribed by Flörsheimer, M.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 363 KB
• Volume: 173
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199905)173:1<15::aid-pssa15>3.0.co;2-8

✦ Synopsis

Second-harmonic microscopy is a fast, interface specific, remote sensing technique for the quantitative in situ investigation of a large number of real interfaces. The second-order optical susceptibility of the individual domains at an interface can be measured and interpreted molecularly. The benefits of stigmatic instead of serial imaging are discussed. A novel experimental geometry is described which allows the construction of a sum frequency microscope. Sum frequency imaging provides interface specific, chemically and conformationally resolved infrared information with the spatial resolution limit of a visible light microscope.