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Scattering of charge carriers by tin impurities in polycrystalline Si-Ge alloys

✍ Scribed by E. V. Khutsishvili; N. P. Kekelidze; V. G. Jzhakeli; M. O. Pagava

Book ID: 110165673
Publisher: SP MAIK Nauka/Interperiodica
Year: 2006
Tongue: English
Weight: 160 KB
Volume: 42
Category: Article
ISSN: 0020-1685
DOI: 10.1134/s0020168506040029

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