Scanning tunneling microscopy study on YBa2Cu3O7−x films with growth stop by observing reflection high-energy electron diffraction oscillations

✍ Scribed by Hirata, K.; Baudenbacher, F.; Lang, H.P.; Güntherodt, H.-J.; Kinder, H.

• Book ID: 123084597
• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 421 KB
• Volume: 195
• Category: Article
• ISSN: 0925-8388
• DOI: 10.1016/0925-8388(93)90697-L