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Scanning tunneling microscopy investigation of single electron tunneling in Co–Al–O and Cu–Al–O granular films

✍ Scribed by Takanashi, K.; Mitani, S.; Chiba, J.; Fujimori, H.

Book ID: 111887360
Publisher: American Institute of Physics
Year: 2000
Tongue: English
Weight: 364 KB
Volume: 87
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.372696

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