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Scanning tunneling microscopy imaging of grain boundaries and triple junctions in copper

✍ Scribed by G.D. Bruce; P. Fortier; G. Palumbo; J.E. Guillet; G.J. Vancso

Book ID
113409003
Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
447 KB
Volume
28
Category
Article
ISSN
1044-5803

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