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Scanning tunneling microscope—A nanoelectronic measuring instrument

✍ Scribed by S. A. Bychikhin; M. O. Gallyamov; V. V. Potemkin; A. V. Stepanov; I. V. Yaminskii


Book ID
105601731
Publisher
Springer US
Year
1998
Tongue
English
Weight
428 KB
Volume
41
Category
Article
ISSN
0543-1972

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