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Scanning Tunneling Microscope-Based Replacement Lithography on Self-Assembled Monolayers. Investigation of the Relationship between Monolayer Structure and Replacement Bias †

✍ Scribed by Lewis, Matthew S.; Gorman, Christopher B.


Book ID
126125333
Publisher
American Chemical Society
Year
2004
Tongue
English
Weight
325 KB
Volume
108
Category
Article
ISSN
0022-3654

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