Scanning transmission electron microscopy studies of the microstructure and chemistry of the YBa2Cu3O7−δ/BaF2 interface
✍ Scribed by J.L. Lee; C.A. Weiss; R.A. Buhrman; J. Silcox
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 531 KB
- Volume
- 30
- Category
- Article
- ISSN
- 0968-4328
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