Scanning SQUID microscope technique for measurements of ultrathin film magnetic properties

✍ Scribed by Sergey A. Gudoshnikov; Ludmila V. Matveets; Konstantin A. Andreev; Alexander M. Tishin; Oleg V. Snigirev; Michael Mueck; Joerg Dechert; Christoph Heiden

• Book ID: 108478645
• Publisher: Elsevier Science
• Year: 1997
• Tongue: English
• Weight: 230 KB
• Volume: 5
• Category: Article
• ISSN: 0964-1807
• DOI: 10.1016/s0964-1807(98)00005-2