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Scanning single-electron transistor microscopy: Imaging individual charges

✍ Scribed by M.J. Yoo; T.A. Fulton; H.F. Hess; R.L. Willett; L.N. Dunkleberger; R.J. Chichester; L.N. Pfeiffer; K.W. West

No coin nor oath required. For personal study only.

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