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Scanning Probe with Tuning Fork Sensor, Microfabricated Silicon Cantilever and Conductive Tip for Microscopy at Cryogenic Temperature

✍ Scribed by Akiyama, Terunobu; Suter, Kaspar; de Rooij, Nicolaas F.; Baumgartner, Andreas; Gildemeister, Arnd E.; Ihn, Thomas; Ensslin, Klaus; Staufer, Urs


Book ID
124082639
Publisher
Institute of Pure and Applied Physics
Year
2006
Tongue
English
Weight
175 KB
Volume
45
Category
Article
ISSN
0021-4922

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