<p><P>This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various
Scanning Probe Microscopy in Nanoscience and Nanotechnology 2
β Scribed by Ali Fatih Sarioglu, Olav Solgaard (auth.), Bharat Bhushan (eds.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Year
- 2011
- Tongue
- English
- Leaves
- 844
- Series
- NanoScience and Technology
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Subjects
Nanotechnology;Characterization and Evaluation of Materials;Surfaces and Interfaces, Thin Films;Nanotechnology and Microengineering;Condensed Matter Physics;Biophysics and Biological Physics
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