<p><P>As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key ro
Scanning probe microscopy : characterization, nanofabrication and device application of functional materials
โ Scribed by Paula Maria Vilarinho; Yossi Rosenwaks; Angus Kingon
- Publisher
- Kluwer Academic
- Year
- 2005
- Tongue
- English
- Leaves
- 503
- Series
- NATO science series., Series II, Mathematics, physics and chemistry
- Category
- Library
No coin nor oath required. For personal study only.
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As the characteristic dimensions of electronic devices continue to shrink, the ability to characterize their electronic properties at the nanometer scale has come to be of outstanding importance. In this sense, Scanning Probe Microscopy (SPM) is becoming an indispensable tool, playing a key role in
<p>Novel scanning probe microscopy (SPM) techniques are used for the characterization of local materials functionalities ranging from chemical reactivity and composition to mechanical, electromechanical, and transport behaviors. In this comprehensive overview, special emphasis is placed on emerging
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