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Scanning probe microscopy as a scalpel to probe filament formation in conductive bridging memory devices

✍ Scribed by Celano, Umberto; Goux, Ludovic; Opsomer, Karl; Iapichino, Martina; Belmonte, Attilio; Franquet, Alexys; Hoflijk, Ilse; Detavernier, Christophe; Jurczak, Malgorzata; Vandervorst, Wilfried


Book ID
120825108
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
956 KB
Volume
120
Category
Article
ISSN
0167-9317

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