๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Scanning Probe Microscopes Look Into New Territories

โœ Scribed by Amato, I.


Book ID
121153215
Publisher
American Association for the Advancement of Science
Year
1993
Tongue
English
Weight
224 KB
Volume
262
Category
Article
ISSN
0036-8075

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Scanning Probe Microscope Control : New
โœ Peter Spizig ๐Ÿ“‚ Article ๐Ÿ“… 2007 ๐Ÿ› Wiley (John Wiley & Sons) โš– 775 KB

Controlling the latest Scanning Probe Microscopes (SPMs) demand highly sophisticated electronics. This is apparent when considering even relatively simple operational procedures such as the tip approach of an Atomic Force Microscope (AFM): The controller must lower the tip towards the sample surface