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Scanning maxwell stress microscope for nanometre-scale surface electrostatic imaging of thin films

✍ Scribed by Hiroshi Yokoyama; Takahito Inoue

Book ID: 107864550
Publisher: Elsevier Science
Year: 1994
Tongue: English
Weight: 665 KB
Volume: 242
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(94)90497-9

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