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Scanning interferometric microscopy for the detection of ultrasmall phase shifts in condensed matter

✍ Scribed by Hwang, J.; Fejer, M.; Moerner, W.

Book ID: 115474522
Publisher: The American Physical Society
Year: 2006
Tongue: English
Weight: 183 KB
Volume: 73
Category: Article
ISSN: 1050-2947
DOI: 10.1103/physreva.73.021802

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