✦ LIBER ✦

Scanning image detection (SID) system for conventional transmission electron microscope (CTEM) images

✍ Scribed by Tanji, Takayoshi ;Tomita, Masahiro ;Kobayashi, Hiroyuki

Publisher: Wiley (John Wiley & Sons)
Year: 1990
Tongue: English
Weight: 404 KB
Volume: 15
Category: Article
ISSN: 0741-0581
DOI: 10.1002/jemt.1060150409

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✦ Synopsis

Abstract

A new image detection system has been developed to display transmission electron microscope (TEM) images on a CRT without a video camera system. Deflection coils placed in both the upper space of an objective lens and in the lower space of the first intermediate lens scan a small electron probe simultaneously. The electrical signal acquired through an improved scintillator and a photomultiplier is synchronized with the scanning signal and displayed in a similar fashion to a conventional scanning TEM (STEM) instrument. A preliminary system using a 100 kV conventional TEM (CTEM) equipped with a hairpin‐type electron gun, produced an image with a spatial resolution of 1 nm.

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