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Scanning force microscopy studies of surface microstructure of Na-β″-Al2O3 single-crystal films

✍ Scribed by O Prakash; R Khare; C.K Kuo; P.S Nicholson

Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
575 KB
Volume
98
Category
Article
ISSN
0167-2738

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✦ Synopsis

The surface features of Na-b0-Al O single-crystal films grown on sapphire and micro a-Al O platelet substrates have 2 3 2 3 been studied by atomic-force-microscopy (AFM). The height and spacing of the growth steps has been measured. Squeezing lines in the horizontal plane were detected and assumed generated by lattice misfits. The transformation mechanism of a-Al O to b0-Al O is discussed on the basis of the observed height of growth steps and surface characteristics of the 2 3 2 3 as-grown Na-b0-Al O films.

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