Scanning electron microscopy, Volume 1978-I: An international review of advances in instrumentation. Techniques, theory and physical applications of the scanning electron microscope. Volume 1979-I: An international review of advances in techniques and applications of the SEM. Volume 1979-II: An international review of advances in techniques and applications of the SEM, volume 1980-I: An international journal of SEM, related techniques and applications: All four volumes edited by O. Johari. Published by Scanning Electron Microscopy Inc., Ill., U.S.A. Vol. 1978-I, xiv + 898 pp.; Vol. 179-I, x + 598 pp.; Vol. 1979:II, xvii + 910 pp.; Vol. 1980-I; xiv + 608 pp.