𝔖 Bobbio Scriptorium
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Scanning electron microscopy study of the cross section of intermetallic compound in the solder ball on the plastic ball grid array package following reliability tests

✍ Scribed by Yeh-Fang Duann; Jen-Hung Chiang; Shung-Jim Yang; Hsun-Wen Chang


Publisher
Springer US
Year
2005
Tongue
English
Weight
221 KB
Volume
34
Category
Article
ISSN
0361-5235

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