𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Scanning electron microscopy observation of high energy α-bombarded molybdenum surfaces

✍ Scribed by S.V. Naidu; P. Sen

Publisher
Elsevier Science
Year
1987
Weight
553 KB
Volume
90
Category
Article
ISSN
0025-5416

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Reflected Electron Energy-loss Microscop
Reflected Electron Energy-loss Microscopy and Scanning Auger Microscopy Study of Semiconductor Surfaces
✍ Paparazzo, E. 📂 Article 📅 1997 🏛 John Wiley and Sons 🌐 English ⚖ 495 KB 👁 2 views

The diagnostic potential of reÑected electron energy-loss microscopy (REELM) and scanning Auger microscopy (SAM) are explored with respect to two particular aspects encountered in the surface microchemical analysis of semiconductor materials : determining the kind of coverage, i.e. whether continuou