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Scanning Electron Microscopy and X-ray Analysis. Von R. E. Lee. Ellis Horwood, PRT Prentice Hall, Englewood Cliffs, USA, 1993. 464 S., geb. 60.00 $. – ISBN 0-13-813759-5

✍ Scribed by Werner Mader


Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
314 KB
Volume
106
Category
Article
ISSN
0044-8249

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