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Scanning electron microscope analysis of fretting fatigue damage

✍ Scribed by R.K. Reeves; D.W. Hoeppne

Publisher: Elsevier Science
Year: 1978
Tongue: English
Weight: 560 KB
Volume: 48
Category: Article
ISSN: 0043-1648
DOI: 10.1016/0043-1648(78)90139-4

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