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Scanning Electron-Beam Dielectric Microscopy for the Investigation of the Temperature Coefficient Distribution of Dielectric Ceramics

✍ Scribed by Yasuo Cho; Osamu Jintsugawa; Kazuhiko Yamanouchi

Book ID: 110828223
Publisher: John Wiley and Sons
Year: 2004
Tongue: English
Weight: 798 KB
Volume: 83
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.2000.tb01375.x

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