Scanning Electroluminescence Microscopy: A Powerful Novel Characterization Tool for Light Emitting Diodes

✍ Scribed by Fischer, P. ;Christen, J. ;Zacharias, M. ;Schwegler, V. ;Kirchner, C. ;Kamp, M.

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 178 KB
• Volume: 176
• Category: Article
• ISSN: 0031-8965
• DOI: 10.1002/(sici)1521-396x(199911)176:1<119::aid-pssa119>3.0.co;2-q