Scanning auger microscopy for the characterization of very thin epitaxial layers in III–V compounds

✍ Scribed by J.F. Bresse

• Book ID: 118361675
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 210 KB
• Volume: 168
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(86)90913-1