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Scanning attachment for a microscope for cytospectrophotometry

✍ Scribed by E. M. Brazhnikov; Yu. E. Morozov; N. V. Nikolaeva; B. L. Pereverzev; S. M. Petukhov; E. K. Russiyan; A. K. Bozhkov


Publisher
Springer US
Year
1971
Tongue
English
Weight
220 KB
Volume
72
Category
Article
ISSN
0007-4888

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This paper presents experimental results from a second-order focusing toroidal spectrometer attachment for the scanning electron microscope (SEM). The energy resolution of the spectrometer is measured to be 0.38% for an angular spread of 7 81, close to the numerical simulated value of 0.32% based up