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Scan speed limit in atomic force microscopy

✍ Scribed by H.-J. BUTT; P. SIEDLE; K. SEIFERT; K. FENDLER; T. SEEGER; E. BAMBERG; A. L. WEISENHORN; K. GOLDIE; A. ENGEL

Book ID: 119836298
Publisher: John Wiley and Sons
Year: 1993
Tongue: English
Weight: 849 KB
Volume: 169
Category: Article
ISSN: 0022-2720
DOI: 10.1111/j.1365-2818.1993.tb03280.x

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