Scan chain configuration based X-filling for low power and high quality testing

✍ Scribed by Chen, Z.; Feng, J.; Xiang, D.; Yin, B.

• Book ID: 117809874
• Publisher: The Institution of Engineering and Technology
• Year: 2010
• Tongue: English
• Weight: 434 KB
• Volume: 4
• Category: Article
• ISSN: 1751-8601
• DOI: 10.1049/iet-cdt.2008.0163