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Scaling of the ductility with yield strength in nanostructured Cu/Cr multilayer films

โœ Scribed by J.Y. Zhang; X. Zhang; G. Liu; G.J. Zhang; J. Sun

Book ID
113898399
Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
303 KB
Volume
63
Category
Article
ISSN
1359-6462

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โœ J.Y. Zhang; X. Zhang; G. Liu; G.J. Zhang; J. Sun ๐Ÿ“‚ Article ๐Ÿ“… 2011 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 996 KB

It was recently suggested that the fracture mode in nanostructured metallic multilayer films (NMFs) is related to the strengthening mechanism. Here, based on extensive experimental examinations on the nanoscale damage of Cu/Cr NMFs with wide ranges of modulation period (from 10 nm to 250 nm) and mod