✦ LIBER ✦
Scaling of strained-Si n-MOSFETs into the ballistic regime and associated anisotropic effects
✍ Scribed by Bufler, F.M.; Fichtner, W.
- Book ID
- 114616980
- Publisher
- IEEE
- Year
- 2003
- Tongue
- English
- Weight
- 326 KB
- Volume
- 50
- Category
- Article
- ISSN
- 0018-9383
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