Sample-thickness dependence and chemical effects in SIMS depth profiling of multilayer langmuir-blodgett films

✍ Scribed by K. Wittmaack; L. Laxhuber; H. Möhwald

• Book ID: 114168034
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 306 KB
• Volume: 18
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/s0168-583x(86)80102-1