✦ LIBER ✦
SAM studies on high-temperature annealing of vanadium thin films on oxidized silicon wafers: Jiann-Ruey Chen et al, J Vac Sci Technol, 20, (3), 1982, 804–806
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 38 KB
- Volume
- 33
- Category
- Article
- ISSN
- 0042-207X
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