S-parameter-measurement-based high-speed signal transient characterization of VLSI interconnects on SiO/sub 2/-Si substrate

✍ Scribed by Yungseon Eo, ; Eisenstadt, W.R.; Jongin Shim,

• Book ID: 121476127
• Publisher: IEEE
• Year: 2000
• Tongue: English
• Weight: 510 KB
• Volume: 23
• Category: Article
• ISSN: 1521-3323
• DOI: 10.1109/6040.861562